9.8
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#ifndef _LINUX_EFI_EMBEDDED_FW_H
#define _LINUX_EFI_EMBEDDED_FW_H

#include <linux/list.h>
#include <linux/mod_devicetable.h>

#define EFI_EMBEDDED_FW_PREFIX_LEN		8

/*
 * This struct is private to the efi-embedded fw implementation.
 * They are in this header for use by lib/test_firmware.c only!
 */
struct efi_embedded_fw {
	struct list_head list;
	const char *name;
	const u8 *data;
	size_t length;
};

/**
 * struct efi_embedded_fw_desc - This struct is used by the EFI embedded-fw
 *                               code to search for embedded firmwares.
 *
 * @name:   Name to register the firmware with if found
 * @prefix: First 8 bytes of the firmware
 * @length: Length of the firmware in bytes including prefix
 * @sha256: SHA256 of the firmware
 */
struct efi_embedded_fw_desc {
	const char *name;
	u8 prefix[EFI_EMBEDDED_FW_PREFIX_LEN];
	u32 length;
	u8 sha256[32];
};

extern const struct dmi_system_id touchscreen_dmi_table[];

int efi_get_embedded_fw(const char *name, const u8 **dat, size_t *sz);

#endif
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     	ˆ¿Ãƒ/3¾ÂÁ g    	/* SPDX-License-Identifier: GPL-2.0 */
/*
 * KUnit API to save and access test attributes
 *
 * Copyright (C) 2023, Google LLC.
 * Author: Rae Moar <rmoar@google.com>
 */

#ifndef _KUNIT_ATTRIBUTES_H
#define _KUNIT_ATTRIBUTES_H

/*
 * struct kunit_attr_filter - representation of attributes filter with the
 * attribute object and string input
 */
struct kunit_attr_filter {
	struct kunit_attr *attr;
	char *input;
};

/*
 * Returns the name of the filter's attribute.
 */
const char *kunit_attr_filter_name(struct kunit_attr_filter filter);

/*
 * Print all test attributes for a test case or suite.
 * Output format for test cases: "# <test_name>.<attribute>: <value>"
 * Output format for test suites: "# <attribute>: <value>"
 */
void kunit_print_attr(void *test_or_suite, bool is_test, unsigned int test_level);

/*
 * Returns the number of fitlers in input.
 */
int kunit_get_filter_count(char *input);

/*
 * Parse attributes filter input and return an objects containing the
 * attribute object and the string input of the next filter.
 */
struct kunit_attr_filter kunit_next_attr_filter(char **filters, int *err);

/*
 * Returns a copy of the suite containing only tests that pass the filter.
 */
struct kunit_suite *kunit_filter_attr_tests(const struct kunit_suite *const suite,
		struct kunit_attr_filter filter, char *action, int *err);

#endif /* _KUNIT_ATTRIBUTES_H */
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     ˆÀÄƒiá7¿¾Â Ù    /* SPDX-License-Identifier: GPL-2.0-or-later */
/*
 *  NAND family Bad Block Management (BBM) header file
 *    - Bad Block Table (BBT) implementation
 *
 *  Copyright Â© 2005 Samsung Electronics
 *  Kyungmin Park <kyungmin.park@samsung.com>
 *
 *  Copyright Â© 2000-2005
 *  Thomas Gleixner <tglx@linuxtronix.de>
 */
#ifndef __LINUX_MTD_BBM_H
#define __LINUX_MTD_BBM_H

/* The maximum number of NAND chips in an array */
#define NAND_MAX_CHIPS		8

/**
 * struct nand_bbt_descr - bad block table descriptor
 * @options:	options for this descriptor
 * @pages:	the page(s) where we find the bbt, used with option BBT_ABSPAGE
 *		when bbt is searched, then we store the found bbts pages here.
 *		Its an array and supports up to 8 chips now
 * @offs:	offset of the pattern in the oob area of the page
 * @veroffs:	offset of the bbt version counter in the oob are of the page
 * @version:	version read from the bbt page during scan
 * @len:	length of the pattern, if 0 no pattern check is performed
 * @maxblocks:	maximum number of blocks to search for a bbt. This number of
 *		blocks is reserved at the end of the device where the tables are
 *		written.
 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
 *              bad) block